- 描探微
- 扫描探针显微镜
- 扫描探针显微术
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scanning probe microscopy中文什么意思
例句与用法
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- The applications of scanning probe microscopy a review
扫描探针显微术的应用综述 - Scanning probe microscopy based nanotechnology
基于扫描探针显微镜的纳米技术 - Scanning probe microscopy of combined snom sfm cantilever probe
结合的扫描探测显微镜 - Scanning probe microscopy ( spm ) related surface science and nanotechnology
与扫描探针有关的表面科学和纳米技术 - Scanning probe microscopy fg 8ou
扫描探针显微镜
百科释义
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.
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